Comment on 'Destructive effect of disorder and bias voltage on interface resonance transmission in symmetric tunnel junctions' - Tusche et al. reply

Authors :: Tusche, C
Meyerheim, Hl
Jedrecy, Nathalie
Renaud, G
Ernst, A
Henk, J
Bruno, P
Kirschner, J
Institut des Nanosciences de Paris (INSP)
Université Pierre et Marie Curie - Paris 6 (UPMC)-Centre National de la Recherche Scientifique (CNRS)
Source :: Physical Review Letters, Physical Review Letters, 2006, 96 (11), pp.119602. ⟨10.1103/PhysRevLett.96.119602⟩
Publication Year :: 2006
Publisher :: HAL CCSD, 2006.
Abstract: International audience; no abstract

Subjects :: [PHYS.COND]Physics [physics]/Condensed Matter [cond-mat]
ComputingMilieux_MISCELLANEOUS

Language :: English
ISSN :: 00319007 and 10797114
Database :: OpenAIRE
Journal :: Physical Review Letters, Physical Review Letters, 2006, 96 (11), pp.119602. ⟨10.1103/PhysRevLett.96.119602⟩
Accession number :: edsair.od......2417..5b35ed7ebf71bb74bd1751d7949b4480
Full Text :: https://doi.org/10.1103/PhysRevLett.96.119602⟩

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