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A comprehensive numerical model of impact ionization in ZnO for high field device simulation

Authors :
Bertazzi, Francesco
Goano, Michele
Bellotti, E.
Publication Year :
2007

Details

Language :
English
Database :
OpenAIRE
Accession number :
edsair.od......2153..4ebaac03852d59e65e3d2b6347a19821

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