Investigation of SiC crystals by means of synchrotron topography

MLA

Wierzchowski, W., et al. Investigation of SiC Crystals by Means of Synchrotron Topography. Jan. 2006. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.od......1108..bef4bbd5785f3bcbddfe9c9f4b51ed06&authtype=sso&custid=ns315887.

APA

Wierzchowski, W., Wieteska, K., Malinowska, A., Wierzbicka, E., Grasza, K., Tymicki, E., Balcer, T., Pawlowska, M., & Graeff, W. (2006). Investigation of SiC crystals by means of synchrotron topography.

Chicago

Wierzchowski, W., K. Wieteska, A. Malinowska, E. Wierzbicka, K. Grasza, E. Tymicki, T. Balcer, M. Pawlowska, and W. Graeff. 2006. “Investigation of SiC Crystals by Means of Synchrotron Topography,” January. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.od......1108..bef4bbd5785f3bcbddfe9c9f4b51ed06&authtype=sso&custid=ns315887.