STRUCTURE ANALYSIS OF BORON-SILICALITE OF A DEFECT-FREE MFI-SILICALITE BY SYNCHROTRON RADIATION SINGLE CRYSTAL DIFFRACTION

Authors :: Milanesio, M.
Viterbo, D.
Palin, L.
Marra, G. L.
Lamberti, Carlo
Aiello, R.
Testa, F.
Publication Year :: 2002
Publisher :: Elsevier BV:PO Box 211, 1000 AE Amsterdam Netherlands:011 31 20 4853757, 011 31 20 4853642, 011 31 20 4853641, EMAIL: nlinfo-f@elsevier.nl, INTERNET: http://www.elsevier.nl, Fax: 011 31 20 4853598, 2002.

Subjects :: Ssingle crystal X-ray diffraction
boron-silicalite defect-free MFI-silicalite
synchrotron radiation
Structure analysis

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