Compositional dependence of the elastic constants and the lattice parameter of Al(x)Ga(1-x)As

Authors :: Gehrsitz, S.
Sigg, H.
Herres, N.
Bachem, K.
Köhler, K.
Reinhart, F.K.
Publica
Publication Year :: 1999
Abstract: Near infrared Brillouin scattering and high resolution x-ray diffraction is used for a precise determination of the elastic constants and the relaxed lattice parameters of Al(x)Ga(1-x)As epitaxial layers (0.1

Subjects :: gallium aluminum arsenide
elastische Konstante
inductively coupled plasma atomic emission spectroscopy
Gallium-Aluminium-Arsenid
Brillouin-Streuung
epitaxy
high-resolution X-ray diffraction
hochauflösende Röntgenumgebung
Zusammensetzungsbestimmung
Epitaxie
Atom-Emissions-Spektroskopie
composition determination
induktiv gekoppeltes Plasma
ICP AES
elastic constant
HRXRD
Poisson Verhältnis
Brillouin scattering
poisson's ratio

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