Modeling the breakdown spots in silicon dioxide films as point contacts

Subjects

Subjects :

Silicon
III-V semiconductors
Semiconductor device modeling
Dielectric breakdown
Semiconductor thin films
Point contacts
Elemental semiconductors
Dielectric thin films
Thin film structure
Experiment design

Details

Database :

OpenAIRE

Accession number :

edsair.od.......272..dfa122ab2a8603f27c043784456dd3c9