Electron transport through electrically induced nanoconstrictions in HfSiON gate stacks

Subjects

Subjects :

Electronic transport
Interfacial properties
Tunneling
Electric currents
Transport properties
Electrical properties
Dielectrics
Dielectric thin films
Materials properties
Leakage currents

Details

Database :

OpenAIRE

Accession number :

edsair.od.......272..94f30b61f919978a421ed97e22197ea5