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Fatigue Resistance of ITI Implant-Abutment Connectors and a comparison of the standard cone with a novel internally keyed design

Authors :
Periard, J.
Wiskott, H. W. A.
Mellal, A.
Scherrer, S. S.
Botsis, J.
Belser, U. C.

Details

Database :
OpenAIRE
Accession number :
edsair.od.......185..f0745002545ce6e4831f4e28c68da791

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