IR-SNOM on lithium fluoride films with regular arrays based on colour centres

Authors :: Cricenti, A.
Longo, G.
Mussi, V.
Generosi, R.
Luce, M.
Perfetti, P.
Vobornik, A.
Margaritondo, G.
Thielen, P.
Sanghera, J. S.
Aggarwal, I. D.
Tolk, N. H.
Baldacchini, G.
Bonfigli, F.
Flora, F.
Marolo, T.
Montereali, R. M.
Faenov, A.
Pikuz, T.
Somma, F.
Piston, D. W.
Publisher :: Wiley-Vch, Inc
Abstract: LiF films have been grown on silicon substrate, irradiated with soft x-rays to create fluorescent regular micrometric-spaced arrays based on colour centres, and studied by Scanning Near-field Optical Microscope (SNOM). Strong variations in the local reflectivity have been observed in the infrared region between 6.1 and 9.2 mum and tentatively ascribed to a modulated variation of the refractive index of the coloured zone with respect to that of the uncoloured LiF matrix. (C) 2003 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.