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Failure analysis of advanced CMOS technology: some trends, state of the art and future challenges

Authors :
Perdu, Philippe
Lewis, Dean
Pouget, V.
Darracq, Frédéric
Publication Year :
2008
Publisher :
HAL CCSD, 2008.

Subjects

Subjects :
ComputingMilieux_MISCELLANEOUS
[SPI.TRON] Engineering Sciences [physics]/Electronics

Details

Language :
English
Database :
OpenAIRE
Accession number :
edsair.od.......166..43f80cf2c3d5519e41bc88d4b4e6bdb1

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