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Ellipsometry with an undetermined polarization state

Authors :
Liu, Fenz
Lee, Christopher James
Chen, Juequan
Louis, Eric
van der Slot, Petrus J.M.
Boller, Klaus J.
Bijkerk, Frederik
Laser Physics & Nonlinear Optics
Source :
Conference on Lasers and Electro-Optics, CLEO 2012
Publication Year :
2012

Abstract

Highly accurate polarization-based measurements can be done without knowing the absolute polarization state of the probing light field. We demonstrate this approach by measuring Ellipsometric data of carbon thin films with high accuracy. OCIS codes: (120.2130) Ellipsometry and polarimetry, (060.2420) Fibers, polarization-maintaining, (060.2270) Fiber characterization, (340.7470) X-ray mirrors.

Subjects

Subjects :
METIS-294183

Details

Language :
English
Database :
OpenAIRE
Journal :
Conference on Lasers and Electro-Optics, CLEO 2012
Accession number :
edsair.narcis........b234d100b8449ee6fe37ab5ffa31b4f1