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Structural and reflective characteristics of multilayers for 6.x nm wavelength

Authors :
Makhotkin, Igor Alexandrovich
Bijkerk, Fred
Louis, Eric
Laser Physics & Nonlinear Optics
Faculty of Science and Technology
XUV Optics
Publication Year :
2013
Publisher :
University of Twente, 2013.

Abstract

The physics investigations described in this thesis have been inspired by the perspective of the application of La/B-based multilayer mirrors in photolithography. This perspective however, demands the highest possible reflectance of the mirrors and full control over the multilayer growth process. The corresponding research in this thesis therefore covers the following topics: a theoretical and experimental analysis of the spectral properties of La/B-based multilayer stacks, an experimental layer composition and growth study of the candidate La/B-based multilayer optics, and the development of techniques to enable characterization of the internal structure of such multilayers.

Details

Language :
English
Database :
OpenAIRE
Accession number :
edsair.narcis........8f0f3f323db51dcb354105b122db3766