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Biot–Savart-Based Design and Workbench Validation at 100 MHz of Transverse Field Surface RF Coils
- Source :
- Electronics; Volume 12; Issue 12; Pages: 2578
- Publication Year :
- 2023
- Publisher :
- Multidisciplinary Digital Publishing Institute, 2023.
-
Abstract
- Radiofrequency (RF) surface coils are extensively used as receivers in magnetic resonance imaging (MRI) and magnetic resonance spectroscopy (MRS) systems thanks to their high signal-to-noise ratio (SNR). For specific magnetic resonance applications, the design of dedicated RF surface coils with a transverse (to the coil’s plane) RF magnetic field pattern can be necessary. Such transverse-field RF coils are constituted by several central linear (parallel or crossing) conductor elements connected by return current paths. Typically, the outer shape of such RF coils is circular or squared, although other geometries can be used. This paper describes the implementation and validation of a transverse-field RF surface coil simulator based on magnetostatic analysis, which permits the design and optimization of square butterfly and figure-of-eight RF coils with adjustable size and mutual distance between the central linear current elements. The simulation results, compared with the ones provided by a standard square loop RF coil, were validated with 100 MHz workbench measurements performed on three home-built prototypes. Finally, two novel quadrature RF coil structures designed by overlapping two orthogonal square butterfly and figure-of-eight RF coils were simulated and theoretically characterized. The RF coils described here should be suitable for a wide range of MRI/MRS preclinical/clinical applications, mainly at fields below 3 T.
- Subjects :
- magnetic resonance
imaging
spectroscopy
simulation
RF coils
workbench
Subjects
Details
- Language :
- English
- ISSN :
- 20799292
- Database :
- OpenAIRE
- Journal :
- Electronics; Volume 12; Issue 12; Pages: 2578
- Accession number :
- edsair.multidiscipl..76e384ae06139d19d82bdc9b6f2d6d18
- Full Text :
- https://doi.org/10.3390/electronics12122578