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Resonant tunneling characteristics in SiO₂/Si double-barrier structures in a wide range of applied voltage
- Source :
- Applied Physics Letters. 83(7):1456-1458
- Publication Year :
- 2003
- Publisher :
- American Institute of Physics, 2003.
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 83
- Issue :
- 7
- Database :
- OpenAIRE
- Journal :
- Applied Physics Letters
- Accession number :
- edsair.jairo.........ecadf464b2967033f1aca61fb20ab7fd