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Change of the V-I curve and critical current with applied tensile strain due to cracking of filaments in Bi2223 composite tape

Authors :
Shin, JK
Ochiai, S
Okuda, H
Sugano, M
Oh, SS
Source :
SUPERCONDUCTOR SCIENCE & TECHNOLOGY. 21(11)
Publication Year :
2008
Publisher :
IOP PUBLISHING LTD, 2008.

Details

Language :
English
ISSN :
09532048
Volume :
21
Issue :
11
Database :
OpenAIRE
Journal :
SUPERCONDUCTOR SCIENCE & TECHNOLOGY
Accession number :
edsair.jairo.........9edbbdd5620278ebfc285ea8822b59ba

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