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Confocal White Light Reflection Imaging for Characterization of Nanostructures

Authors :
Du, C. L.
You, Y. M.
Ni, Z. H.
Kasim, J.
Shen, Z. X.
Source :
Advanced Photonic Sciences
Publication Year :
2012
Publisher :
InTech, 2012.

Details

Language :
English
Database :
OpenAIRE
Journal :
Advanced Photonic Sciences
Accession number :
edsair.intech........a97d736b43b7c34030f24724a075cce4