Beam Test Results of the BTeV Silicon Pixel Detector

Authors :: G. Chiodini
J.A. Appel
M. Artuso
J.N. Butler
G. Cancelo
G. Cardoso
H. Cheung
D.C. Christian
A. Colautti
R. Coluccia
M.Di Corato
E.E. Gottschalk
B.K. Hall
J. Hoff
P.A. Kasper
R. Kutschke
S.W. Kwan
A. Mekkaoui
D. Menasce
C. Newsom
S. Sala
R. Yarema
J.C. Wang
S. Zimmermann
Source :: Scopus-Elsevier
Publication Year :: 2000
Abstract: The results of the BTeV silicon pixel detector beam test carried out at Fermilab in 1999-2000 are reported. The pixel detector spatial resolution has been studied as a function of track inclination, sensor bias, and readout threshold.<br />8 pages of text, 8 figures, Proceedings paper of Pixel 2000: International Workshop on Semiconductor Pixel Detectors for Particles and X-Rays, Genova, June 5-8, 2000

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