Direct S -matrix calculation for diffractive structures and metasurfaces

Authors :: Yves Jourlin
Alexey A. Shcherbakov
Denis F. Baidin
Yury V. Stebunov
Thomas Kämpfe
Moscow Institute of Physics and Technology [Moscow] (MIPT)
Laboratoire Hubert Curien [Saint Etienne] (LHC)
Institut d'Optique Graduate School (IOGS)-Université Jean Monnet [Saint-Étienne] (UJM)-Centre National de la Recherche Scientifique (CNRS)
Source :: Physical Review E, Physical Review E, American Physical Society (APS), 2018, 97 (6), ⟨10.1103/PhysRevE.97.063301⟩
Publication Year :: 2018
Publisher :: American Physical Society (APS), 2018.
Abstract: The paper presents a derivation of analytical components of S-matrices for arbitrary planar diffractive structures and metasurfaces in the Fourier domain. Attained general formulas for S-matrix components can be applied within both formulations in the Cartesian and curvilinear metric. A numerical method based on these results can benefit from all previous improvements of the Fourier domain methods. In addition, we provide expressions for S-matrix calculation in case of periodically corrugated layers of 2D materials, which are valid for arbitrary corrugation depth-to-period ratios. As an example the derived equations are used to simulate resonant grating excitation of graphene plasmons and an impact of silica interlayer on corresponding reflection curves.<br />Comment: 21 pages, 5 figures