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UV-Laser Annealing for Improved Resistive Switching Performance and Reliability of Flexible Resistive Random-Access Memory

Authors :
Seung Woo Han
Moo Whan Shin
Source :
SSRN Electronic Journal.
Publication Year :
2022
Publisher :
Elsevier BV, 2022.

Details

ISSN :
15565068
Database :
OpenAIRE
Journal :
SSRN Electronic Journal
Accession number :
edsair.doi.dedup.....fd0306c35a7bde31757736db771480af
Full Text :
https://doi.org/10.2139/ssrn.4002369