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High Reliability UWB Monopole Antenna Using Planar Embedded Resistance for Mars Subsurface Exploration

Authors :
Yicai Ji
Wei Lu
Li Yuxi
Bin Zhou
Guangyou Fang
Shen Shaoxiang
Tang Chuanjun
Source :
Electronics, Volume 10, Issue 6, Electronics, Vol 10, Iss 682, p 682 (2021)
Publication Year :
2021
Publisher :
Multidisciplinary Digital Publishing Institute, 2021.

Abstract

The Tianwen-1 of China is expected to land and explore on the planet Mars in May 2021, carrying a Mars Rover-mounted Subsurface Penetrating Radar (RoSPR) system. A VHF band ultra-wideband (UWB) monopole antenna integrated on the Mars Rover, and described in this paper, has been designed for the subsurface exploration of Mars tens of meters deep. Conventional antenna design methods usually prove difficult in taking into account several key parameters such as miniaturization, broadband characteristics and radiation efficiency. Moreover, there is almost no special research on the reliability of antennas. For this purpose, a miniaturized air-coupled monopole antenna integrated with the Mars Rover has been designed. The overall length of the antenna is 0.13 λ at the lowest operating frequency. In addition, the classical Wu–King profile is improved, which not only satisfies the operating bandwidth of the antenna, but also increases the gain by 3–4 dB. In the design, the innovative application of planar embedded resistance greatly enhances the reliability of the antenna and thereby ensures that the antenna can work on Mars for a long term. This is the first application of this antenna design method in the aerospace field. Because it is difficult to test the low-frequency antenna accurately, a 1:4 scale model of the antenna and Rover is fabricated to equivalently measure the radiation characteristics of the antenna. Furthermore, the performance and practicability of the antenna and radar system are verified on the glacier.

Details

Language :
English
ISSN :
20799292
Database :
OpenAIRE
Journal :
Electronics
Accession number :
edsair.doi.dedup.....fc881b0a70f9cde53efdd33364c7cbf0
Full Text :
https://doi.org/10.3390/electronics10060682