Back to Search Start Over

Design of defected TaN supercells dataset for structural and elastic properties from ab initio simulations and comparison to experimental data

Authors :
Gregory Abadias
Chen-Hui Li
Laurent Belliard
Qing-Miao Hu
Nicolas Greneche
Philippe Djemia
Laboratoire des Sciences des Procédés et des Matériaux (LSPM)
Institut Galilée-Université Sorbonne Paris Cité (USPC)-Centre National de la Recherche Scientifique (CNRS)-Université Sorbonne Paris Nord
Institut Pprime (PPRIME)
Université de Poitiers-ENSMA-Centre National de la Recherche Scientifique (CNRS)
Institut des Nanosciences de Paris (INSP)
Sorbonne Université (SU)-Centre National de la Recherche Scientifique (CNRS)
Source :
Data in Brief, Data in Brief, Elsevier, 2020, 30, pp.105411. ⟨10.1016/j.dib.2020.105411⟩, Data in Brief, Vol 30, Iss, Pp 105411-(2020)
Publication Year :
2019

Abstract

These data are supplied for supporting their interpretations and discussions provided in the research article “Large influence of vacancies on the elastic constants of cubic epitaxial tantalum nitride layers grown by reactive magnetron sputtering” by Abadias et al. (2020) [doi: 10.1016/j.actamat.2019.11.041 ]. The datasheet describes the experimental methods used to measure the longitudinal (VL) and transverse (VT) sound velocities of cubic epitaxial TaN/MgO thin films, and their related cubic elastic constants (c11, c12 and c44), by the picosecond laser ultrasonic (PLU) and the Brillouin light scattering (BLS) techniques, respectively. First-principles numerical simulations provide additional data using specifically designed supercells of TaN structures, generated either by hand or using the alloy theoretical automated toolkit (ATAT) method [A. Zunger et al. (1990)], with different configurations (random, cluster and ordered) of defects (Ta and N vacancies). Phonons calculations support discussion of dynamical mechanical stability of defected TaN cubic structures. The data illustrate the huge role of vacancies in elastic properties and phase stability of TaN films.

Details

ISSN :
23523409
Volume :
30
Database :
OpenAIRE
Journal :
Data in brief
Accession number :
edsair.doi.dedup.....f9f6a8f778c968bb6b7214e7d3fb0d3c
Full Text :
https://doi.org/10.1016/j.dib.2020.105411⟩