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Robustness study of a fast protection method based on the gate-charge dedicated for SiC MOSFETs power device
- Source :
- Microelectronics Reliability, Microelectronics Reliability, Elsevier, 2021, pp.114246. ⟨10.1016/j.microrel.2021.114246⟩, 32th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2021, 32th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2021, Oct 2021, Bordeaux, France
- Publication Year :
- 2021
- Publisher :
- HAL CCSD, 2021.
-
Abstract
- International audience; This paper focuses on the extensive robustness validation of a gate charge detection method designed for SiC MOSFETs under short-circuit operation, and, in terms of failure-modes. The benefits of having a fast (submicrosecond-150ns) detection method is illustrated by a 1D thermo-metallurgical simulation. This method is integrated owing to an optimized SMD/PCB technology (Surface-Mount Device/ Printed Circuit Board).
- Subjects :
- Fault under load
Computer science
020209 energy
02 engineering and technology
Hardware_PERFORMANCEANDRELIABILITY
Gate-charge
Robustness (computer science)
0202 electrical engineering, electronic engineering, information engineering
Electronic engineering
Hardware_INTEGRATEDCIRCUITS
SiC MOSFET
Electrical and Electronic Engineering
Safety, Risk, Reliability and Quality
Robustness
Hard switching fault
Power device
020208 electrical & electronic engineering
[SPI.NRJ]Engineering Sciences [physics]/Electric power
Charge (physics)
Condensed Matter Physics
Atomic and Molecular Physics, and Optics
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
Power (physics)
[SPI.NRJ] Engineering Sciences [physics]/Electric power
Hardware_LOGICDESIGN
Subjects
Details
- Language :
- English
- ISSN :
- 00262714
- Database :
- OpenAIRE
- Journal :
- Microelectronics Reliability, Microelectronics Reliability, Elsevier, 2021, pp.114246. ⟨10.1016/j.microrel.2021.114246⟩, 32th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2021, 32th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2021, Oct 2021, Bordeaux, France
- Accession number :
- edsair.doi.dedup.....f6dd28a8f85e4e675bcd3d0e864045b3
- Full Text :
- https://doi.org/10.1016/j.microrel.2021.114246⟩