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Topological Homogeneity for Electron Microscopy Images
- Source :
- idUS. Depósito de Investigación de la Universidad de Sevilla, instname, Computational Topology in Image Context ISBN: 9783030108274, CTIC
- Publication Year :
- 2019
- Publisher :
- Springer, 2019.
-
Abstract
- In this paper, the concept of homogeneity is defined, from a topological perspective, in order to analyze how uniform is the material composition in 2D electron microscopy images. Topological multiresolution parameters are taken into account to obtain better results than classical techniques. Ministerio de Economía y Competitividad MTM2016-81030-P Ministerio de Economía y Competitividad TEC2012-37868-C04-02
- Subjects :
- 010302 applied physics
Materials science
Homogeneity (statistics)
Perspective (graphical)
02 engineering and technology
021001 nanoscience & nanotechnology
Topology
01 natural sciences
law.invention
law
0103 physical sciences
Electron microscopy
Images
Homogeneity
Electron microscope
0210 nano-technology
Topology (chemistry)
Subjects
Details
- ISBN :
- 978-3-030-10827-4
- ISBNs :
- 9783030108274
- Database :
- OpenAIRE
- Journal :
- idUS. Depósito de Investigación de la Universidad de Sevilla, instname, Computational Topology in Image Context ISBN: 9783030108274, CTIC
- Accession number :
- edsair.doi.dedup.....f3322050162480105184cbbc37193766