Characterization of the Percival detector with soft X-rays

Authors :: Frank Scholz
Dario Giuressi
G. Pinaroli
Manuela Kuhn
M. Zimmer
Tim Gerhardt
Vahagn Vardanyan
April D. Jewell
Gregori Iztok
J. Correa
R.H. Menk
Kai Bagschik
Martin Scarcia
B. Marsh
F. Orsini
S. Lange
Michael E. Hoenk
Polad Shikhaliev
A. Greer
Moritz Hoesch
Kyung Sook Kim
L. Stebel
Frank Okrent
HyoJung Hyun
I. Sedgwick
Steve Aplin
Shouleh Nikzad
F. Krivan
Seonghan Kim
U. Pedersen
Alessandro Marras
Giuseppe Cautero
Cornelia B. Wunderer
William T. Nichols
Todd J. Jones
T. Nicholls
Nicola Guerrini
I. Shevyakov
Nicola Tartoni
Heinz Graafsma
Seungyu Rah
Arkadiusz Dawiec
Source :: Journal of synchrotron radiation 28(1), 131-145 (2021). doi:10.1107/S1600577520013958, Journal of Synchrotron Radiation
Publication Year :: 2021
Publisher :: International Union of Crystallography (IUCr), 2021.
Abstract: Journal of synchrotron radiation 28(1), 131 - 145 (2021). doi:10.1107/S1600577520013958<br />In this paper the back-side-illuminated Percival 2-Megapixel (P2M) detector is presented, along with its characterization by means of optical and X-ray photons. For the first time, the response of the system to soft X-rays (250 eV to 1 keV) is presented. The main performance parameters of the first detector are measured, assessing the capabilities in terms of noise, dynamic range and single-photon discrimination capability. Present limitations and coming improvements are discussed.<br />Published by Wiley-Blackwell, [S.l.]