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Toward simultaneous assessment of In and N in InGaAsN alloys by quantitative STEM-ADF imaging
- Source :
- Microscopy and microanalysis (Internet) (2011). doi:10.1017/S143192761101018X, info:cnr-pdr/source/autori:V Grilloa1, K Müllera2, F Glasa3, K Volza4 and A Rosenauera5/titolo:Toward simultaneous assessment of In and N in InGaAsN alloys by quantitative STEM-ADF imaging/doi:10.1017%2FS143192761101018X/rivista:Microscopy and microanalysis (Internet)/anno:2011/pagina_da:/pagina_a:/intervallo_pagine:/volume
- Publication Year :
- 2011
- Publisher :
- Springer., New York, Stati Uniti d'America, 2011.
-
Abstract
- Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
- Subjects :
- Materials science
Instrumentation
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- Microscopy and microanalysis (Internet) (2011). doi:10.1017/S143192761101018X, info:cnr-pdr/source/autori:V Grilloa1, K Müllera2, F Glasa3, K Volza4 and A Rosenauera5/titolo:Toward simultaneous assessment of In and N in InGaAsN alloys by quantitative STEM-ADF imaging/doi:10.1017%2FS143192761101018X/rivista:Microscopy and microanalysis (Internet)/anno:2011/pagina_da:/pagina_a:/intervallo_pagine:/volume
- Accession number :
- edsair.doi.dedup.....f2807ec4e52e83994d2c042ced764136
- Full Text :
- https://doi.org/10.1017/S143192761101018X