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Ultrasensitive Refractometry via Supercritical Angle Fluorescence

Authors :
Yoav Shechtman
Boris Ferdman
Yonathan Haimovich
Onit Alalouf
Lucien E. Weiss
Source :
ACS Nano. 12:11892-11898
Publication Year :
2018
Publisher :
American Chemical Society (ACS), 2018.

Abstract

Refractometry, namely, the measurement of refractive index (RI), provides information about various sample properties such as concentrations and molecular structure. One physical phenomenon which enables precise determination of a sample’s RI in a microscope is the supercritical-angle fluorescence. This effect is observed when the fluorescence from an emitter near a glass-medium interface is captured by an objective lens with a high numerical aperture. The materials’ index mismatch creates a distinguishable transition in the intensity pattern at the back focal plane of the objective that changes proportionally to the RI of the media. Here, we present a refractometry approach in which the fluorophores are preattached to the bottom surface of a microfluidic channel, enabling highly sensitive determination of the RI using tiny amounts of liquid (picoliters). With this method, we attained a standard deviation of 3.1 × 10–5 and a repeatability of 2.7 × 10–5 RI units. We first determine the capabilities of the ...

Details

ISSN :
1936086X and 19360851
Volume :
12
Database :
OpenAIRE
Journal :
ACS Nano
Accession number :
edsair.doi.dedup.....f228a0cbb1c2fc138ef15e1bc61b124b
Full Text :
https://doi.org/10.1021/acsnano.8b05849