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New selective wet processing

Authors :
Paolo Nenzi
Rocco Crescenzi
M. Balucani
D. Ciarniello
Dario Bernardi
Konstantin Kholostov
Source :
2013 IEEE 63rd Electronic Components and Technology Conference.
Publication Year :
2013
Publisher :
IEEE, 2013.

Abstract

A new selective processing technique based on a confined dynamic liquid drop\meniscus is presented. This approach is represented by the localized wet treatment of silicon wafers using dynamic liquid drop that while is in contact with the wafer forms a dynamic liquid meniscus. The main scientific innovation and relevance introduced by this work have been applied to industrial solar cell production and on silicon wafer metal bumps formation for the IC interconnection (i.e. copper pillars). Such new technique allows to touch in specific defined positions the silicon wafer in order to perform any kind of wet processing (e.g. etching, cleaning and/or plating) without the need of any protective resist. To investigate on pendant dynamic liquid drops and dynamic liquid meniscus use of computational fluid dynamic technique (i.e. numerical techniques to accurately predict fluid flows) was followed and is presented. An experimental setup has been built to validate the calculations. Numerical results showed a good agreement with experimental ones. Prototypes heads, using stereo-lithography systems, were developed and localized selective plating without the need of lithography step was performed on silicon.

Details

Database :
OpenAIRE
Journal :
2013 IEEE 63rd Electronic Components and Technology Conference
Accession number :
edsair.doi.dedup.....f0a0f562c91f73832c88bd86fa49d6fe
Full Text :
https://doi.org/10.1109/ectc.2013.6575579