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Deposition of Extended Ordered Ultrathin Films of Au 38 (SC 2 H 4 Ph) 24 Nanocluster using Langmuir–Blodgett Technique

Authors :
Plinio Maroni
Alexis Chennevière
Mohammad M Dadras
Lay-Theng Lee
Michal Swierczewski
Thomas Bürgi
Department of Inorganic, Analytical and Applied Chemistry
Laboratory of Colloid and Surface Chemistry (LCSC)
Université de Genève (UNIGE)-Université de Genève (UNIGE)
LLB - Matière molle et biophysique (MMB)
Laboratoire Léon Brillouin (LLB - UMR 12)
Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Saclay-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Saclay
University of Geneva [Switzerland]
Université de Genève (UNIGE)
Centre Suisse d'Electronique et de Microtechnique SA [Neuchatel] (CSEM)
Centre Suisse d'Electronique et Microtechnique SA (CSEM)
Université de Genève = University of Geneva (UNIGE)-Université de Genève = University of Geneva (UNIGE)
Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS)
Université de Genève = University of Geneva (UNIGE)
Source :
Small, Small, Wiley-VCH Verlag, 2020, pp.2005954. ⟨10.1002/smll.202005954⟩, Small, Wiley-VCH Verlag, In press, 17, pp.2005954. ⟨10.1002/smll.202005954⟩, Small, 2020, pp.2005954. ⟨10.1002/smll.202005954⟩, Small, In press, 17, pp.2005954. ⟨10.1002/smll.202005954⟩
Publication Year :
2020
Publisher :
HAL CCSD, 2020.

Abstract

International audience; Langmuir–Blodgett technique is utilized to deposit ultrathin films of Au$_{38}$(SC$_2$H$_4$Ph)$_{24}$ nanocluster onto solid surfaces such as mica and silicon. The morphologies of the films transferred at various surface pressures within the mono/bi/trilayer regime are studied by atomic force microscopy (AFM). The time spent on the water surface before the deposition has a decisive effect on the final ordering of nanoclusters within the network and is studied by fast AFM, X-ray reflectivity, and grazing-incidence wide-angle X-ray scattering.

Details

Language :
English
ISSN :
16136810 and 16136829
Database :
OpenAIRE
Journal :
Small, Small, Wiley-VCH Verlag, 2020, pp.2005954. ⟨10.1002/smll.202005954⟩, Small, Wiley-VCH Verlag, In press, 17, pp.2005954. ⟨10.1002/smll.202005954⟩, Small, 2020, pp.2005954. ⟨10.1002/smll.202005954⟩, Small, In press, 17, pp.2005954. ⟨10.1002/smll.202005954⟩
Accession number :
edsair.doi.dedup.....ef6327605aadede2f561ad47559f6fa9