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Hydrogen passivation of acceptors in silicon: a combined PAC and resistivity study

Authors :
Robert Magerle
H. Skudlik
P. Pross
Th. Wichert
Walter Pfeiffer
Manfred Deicher
R. Keller
Publication Year :
1992
Publisher :
Elsevier, 1992.

Abstract

PAC measurements at 111 In, yielding information on the amount of formed In-H pairs, and four point resistivity measurements were combined to study the correlation between pair formation and electrical deactivation of acceptors in p-Si samples during passivation with H and thermal reactivation. Passivation was performed by means of low energy (200 eV) H + implantation which proved to be quite efficient at 400 K. A complete passivation of the In profile with a peak concentration of 10 18 cm −3 could be achieved. The results show, that the deactivation and reactivation of the In acceptors quantitatively coincide with the formation and dissociation of In-H pairs.

Details

Language :
English
Database :
OpenAIRE
Accession number :
edsair.doi.dedup.....ef21fc4d1853d482cc3f4fdc6c20a62c
Full Text :
https://doi.org/10.1016/0168-583x(92)95196-x