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Modeling of inductively coupled plasma Ar/Cl-2/N-2 plasma discharge: Effect of N-2 on the plasma properties

Authors :
Marie Claude Fernandez
Christophe Cardinaud
R. Chanson
Jean Pierre Landesman
Ahmed Rhallabi
Institut des Matériaux Jean Rouxel (IMN)
Université de Nantes - UFR des Sciences et des Techniques (UN UFR ST)
Université de Nantes (UN)-Université de Nantes (UN)-Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC)-Ecole Polytechnique de l'Université de Nantes (EPUN)
Université de Nantes (UN)-Université de Nantes (UN)
Institut de Physique de Rennes (IPR)
Université de Rennes 1 (UR1)
Université de Rennes (UNIV-RENNES)-Université de Rennes (UNIV-RENNES)-Centre National de la Recherche Scientifique (CNRS)
Université de Nantes (UN)-Université de Nantes (UN)-Ecole Polytechnique de l'Université de Nantes (EPUN)
Université de Nantes (UN)-Université de Nantes (UN)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)
Université de Rennes (UR)-Centre National de la Recherche Scientifique (CNRS)
Source :
Journal of Vacuum Science and Technology A, Journal of Vacuum Science and Technology A, American Vacuum Society, 2013, 31 (1), pp.011301. ⟨10.1116/1.4766681⟩, Journal of Vacuum Science & Technology A, Journal of Vacuum Science & Technology A, 2013, 31 (1), pp.011301. ⟨10.1116/1.4766681⟩
Publication Year :
2013
Publisher :
HAL CCSD, 2013.

Abstract

International audience; A global kinetic model of Cl-2/Ar/N-2 plasma discharge has been developed, which allows calculation of the densities and fluxes of all neutral and charged species considered in the reaction scheme, as well as the electron temperature, as a function of the operating conditions. In this work, the results from the global model are first compared to the calculations given by other models. Our simulation results are focused on the effect of nitrogen adding to the Cl-2/Ar plasma mixture, which impacts both neutral and charged species transport phenomena. The N-2 percentage is varied to the detriment of Cl-2 by keeping the total flow rates of Cl-2 and N-2 constant. In order to better understand the impact of N-2 addition to the Cl-2/Ar gas mixture, the authors analyzed the output plasma parameters calculated from the model for different N-2 flow rate percentages. Indeed, the simulation results show a decrease in electron density and an increase in electron temperature with increasing percentage of N-2. Particular attention is paid to the analysis of electronegativity, Cl-2 and N-2 dissociation, and positive ion to neutral flux ratio evolution by varying percentage of N-2. Such parameters have a direct effect on the etching anisotropy of the materials during the etching process. (C) 2013 American Vacuum Society.

Details

Language :
English
ISSN :
07342101
Database :
OpenAIRE
Journal :
Journal of Vacuum Science and Technology A, Journal of Vacuum Science and Technology A, American Vacuum Society, 2013, 31 (1), pp.011301. ⟨10.1116/1.4766681⟩, Journal of Vacuum Science & Technology A, Journal of Vacuum Science & Technology A, 2013, 31 (1), pp.011301. ⟨10.1116/1.4766681⟩
Accession number :
edsair.doi.dedup.....eecba29069a39dc25470a73cbd57b5b4
Full Text :
https://doi.org/10.1116/1.4766681⟩