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Ionic modulation at the LaAlO$_3$/KTaO$_3$ interface for extreme high-mobility two-dimensional electron gas
- Source :
- Advanced Materials Interfaces, Advanced Materials Interfaces, 2022, 9 (35), pp.2201633. ⟨10.1002/admi.202201633⟩
- Publication Year :
- 2022
- Publisher :
- arXiv, 2022.
-
Abstract
- Due to the coexistence of many emergent phenomena, including 2D superconductivity and a large Rashba spin-orbit coupling, 5d transition metal oxides based two-dimensional electron systems (2DESs) have been prospected as one of the potential intrants for modern electronics. However, despite the lighter electron mass, the mobility of carriers, a key requisite for high-performance devices, in 5d-oxides devices remains far behind their 3d-oxides analogs. The carriers mobility in these oxides is significantly hampered by the inevitable presence of defects generated during the growth process. Here, we report very high mobility ($\sim$ 22650 cm$^2$V$^{-1}$s$^{-1}$) of 5d-2DES confined at the LaAlO$_3$/KTaO$_3$ interface. The high mobility, which is beyond the values observed in LaAlO$_3$/SrTiO$_3$ and $\gamma$-Al$_2$O$_3$/SrTiO$_3$ systems in the same carrier-density range, is achieved using the ionic-liquid gating at room temperature. We postulate that the ionic-liquid gating affects the oxygen vacancies and efficiently reduces any disorder at the interface. Investigating density and mobility in a broad range of back-gate voltage, we reveal that the mobility follows the power-law $\mu \propto n^{1.2}$, indicating the very high quality of ionic-liquid-gated LaAlO$_3$/KTaO$_3$ devices, consistent with our postulate. Further, the analysis of the quantum oscillations measured in high magnetic fields confirms that the high-mobility electrons occupy the electronic sub-bands emerging from the Ta:5d orbitals of KTaO$_3$.<br />Comment: 20 pages, 6 figures
- Subjects :
- ionic liquids
spin-to-charge conversions
Condensed Matter - Materials Science
high-mobility two-dimensional electron gas
Mechanics of Materials
Mechanical Engineering
oxide interfaces
[CHIM]Chemical Sciences
Materials Science (cond-mat.mtrl-sci)
FOS: Physical sciences
electric field effect
Subjects
Details
- ISSN :
- 21967350
- Database :
- OpenAIRE
- Journal :
- Advanced Materials Interfaces, Advanced Materials Interfaces, 2022, 9 (35), pp.2201633. ⟨10.1002/admi.202201633⟩
- Accession number :
- edsair.doi.dedup.....ec609ada01036754fc337f17eabcaa9a
- Full Text :
- https://doi.org/10.48550/arxiv.2209.12390