Anisotropic Complex Refractive Indices of Atomically Thin Materials: Determination of the Optical Constants of Few-Layer Black Phosphorus

In this work we briefly review the studies of the optical constants of monolayer transition metal dichalcogenides and few layer black phosphorus, with particular emphasis to the complex dielectric function and refractive index. Specifically, we give an estimate of the complex index of refraction of phosphorene and few-layer black phosphorus. We extracted the complex index of refraction of this material from differential reflectance data reported in literature by employing a constrained Kramers-Kronig analysis. Finally, we studied the linear optical response of multilayer systems embedding phosphorene by using the transfer matrix method.
Comment: 11 pages, 3 figures