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Fast X-ray microdiffraction techniques for studying irreversible transformations in materials

Authors :
Sol M. Gruner
Philippe O. Pouliquen
S. C. Barron
Eric M. Dufresne
Timothy P. Weihs
Stephen T. Kelly
Jonathan C. Trenkle
Noël Walker
Mark W. Tate
Lucas J. Koerner
Todd C. Hufnagel
Source :
Journal of Synchrotron Radiation
Publication Year :
2011
Publisher :
International Union of Crystallography (IUCr), 2011.

Abstract

Techniques are described for X-ray diffraction combining micrometer-scale spatial resolution with microsecond-scale temporal resolution for studying rapid localized irreversible transformations in materials.<br />A pair of techniques have been developed for performing time-resolved X-ray microdiffraction on irreversible phase transformations. In one technique capillary optics are used to focus a high-flux broad-spectrum X-ray beam to a 60 µm spot size and a fast pixel array detector is used to achieve temporal resolution of 55 µs. In the second technique the X-rays are focused with Kirkpatrick–Baez mirrors to achieve a spatial resolution better than 10 µm and a fast shutter is used to provide temporal resolution better than 20 µs while recording the diffraction pattern on a (relatively slow) X-ray CCD camera. Example data from experiments are presented where these techniques are used to study self-propagating high-temperature synthesis reactions in metal laminate foils.

Details

ISSN :
09090495
Volume :
18
Database :
OpenAIRE
Journal :
Journal of Synchrotron Radiation
Accession number :
edsair.doi.dedup.....eb29fbd9de18fa74193ac6b00bcaa1a1
Full Text :
https://doi.org/10.1107/s0909049511002640