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ORIGAMI: Mining Representative Orthogonal Graph Patterns
- Source :
- ICDM, Seventh International Conference on Data Mining (ICDM'07), Seventh International Conference on Data Mining (ICDM'07), Oct 2007, Omaha, United States. pp.153-163, ⟨10.1109/ICDM.2007.45⟩
- Publication Year :
- 2007
- Publisher :
- IEEE, 2007.
-
Abstract
- International audience; In this paper, we introduce the concept of alpha-orthogonal patterns to mine a representative set of graph patterns. Intuitively, two graph patterns are alpha-orthogonal if their similarity is bounded above by alpha. Each alpha-orthogonal pattern is also a representative for those patterns that are at least beta similar to it. Given user defined alpha, beta in [0, 1], the goal is to mine an alpha-orthogonal, beta-representative set that minimizes the set of unrepresented patterns. We present ORIGAMI, an effective algorithm for mining the set of representative orthogonal patterns. ORIGAMI first uses a randomized algorithm to randomly traverse the pattern space, seeking previously unexplored regions, to return a set of maximal patterns. ORIGAMI then extracts an alpha-orthogonal, beta-representative set from the mined maximal patterns. We show the effectiveness of our algorithm on a number of real and synthetic datasets. In particular, we show that our method is able to extract high quality patterns even in cases where existing enumerative graph mining methods fail to do so.
- Subjects :
- Traverse
business.industry
Two-graph
User defined
Graph theory
Pattern recognition
02 engineering and technology
computer.software_genre
Randomized algorithm
020204 information systems
Graph patterns
0202 electrical engineering, electronic engineering, information engineering
Graph (abstract data type)
[INFO]Computer Science [cs]
020201 artificial intelligence & image processing
Artificial intelligence
Data mining
Pattern space
business
computer
Mathematics
Subjects
Details
- Database :
- OpenAIRE
- Journal :
- Seventh IEEE International Conference on Data Mining (ICDM 2007)
- Accession number :
- edsair.doi.dedup.....e9d12cd9441c8724739bfa7a192eaad4