Carrier Mobility Enhancement of Tensile Strained Si and SiGe Nanowires via Surface Defect Engineering

MLA

Jung-Sung Kim, et al. “Carrier Mobility Enhancement of Tensile Strained Si and SiGe Nanowires via Surface Defect Engineering.” Nano Letters, vol. 15, no. 11, Oct. 2015. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi.dedup.....e93068959b2ecbf44de6cac61c256d13&authtype=sso&custid=ns315887.

APA

Jung-Sung Kim, Kwangsik Jeong, Jae-Pyoung Ahn, Jung Hwa Seo, Seung Hoon Oh, Hyun You Kim, Jong-Uk Bae, Sehoon Kim, Jin Won Ma, Mann Ho Cho, & Woonhyoung Lee. (2015). Carrier Mobility Enhancement of Tensile Strained Si and SiGe Nanowires via Surface Defect Engineering. Nano Letters, 15(11).

Chicago

Jung-Sung Kim, Kwangsik Jeong, Jae-Pyoung Ahn, Jung Hwa Seo, Seung Hoon Oh, Hyun You Kim, Jong-Uk Bae, et al. 2015. “Carrier Mobility Enhancement of Tensile Strained Si and SiGe Nanowires via Surface Defect Engineering.” Nano Letters 15 (11). http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi.dedup.....e93068959b2ecbf44de6cac61c256d13&authtype=sso&custid=ns315887.