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Minimizing scattering from antireflective surfaces replicated from low-aspect-ratio black silicon
- Source :
- Christiansen, A B, Clausen, J, Mortensen, N A & Kristensen, A 2012, ' Minimizing scattering from antireflective surfaces replicated from low-aspect-ratio black silicon ', Applied Physics Letters, vol. 101, no. 13, pp. 131902 . https://doi.org/10.1063/1.4754691
- Publication Year :
- 2012
-
Abstract
- The scattering properties of randomly structured antireflective black silicon polymer replica have been investigated. Using a two-step casting process, the structures can be replicated in Ormocomp on areas of up to 3 in. in diameter. Fourier analysis of scanning electron microscopy images of the structures shows that the scattering properties of the surfaces are related to the spatial periods of the nanostructures. Structures with a dominating spatial period of 160 nm, a height of 200 nm, and aspect ratio of 1.3 show insignificant scattering of light with wavelength above 500 nm and lower the reflectance by a factor of two.
- Subjects :
- Materials science
Physics and Astronomy (miscellaneous)
Silicon
Aspect ratio
Scattering
business.industry
Scanning electron microscope
Black silicon
chemistry.chemical_element
Light scattering
law.invention
chemistry.chemical_compound
Wavelength
Anti-reflective coating
Optics
chemistry
law
business
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- Christiansen, A B, Clausen, J, Mortensen, N A & Kristensen, A 2012, ' Minimizing scattering from antireflective surfaces replicated from low-aspect-ratio black silicon ', Applied Physics Letters, vol. 101, no. 13, pp. 131902 . https://doi.org/10.1063/1.4754691
- Accession number :
- edsair.doi.dedup.....e8beb5466ff8bf0d8c63bf6680650ced