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Development of a light field measuring system with corrected distortion based on imaging analysis
- Source :
- Applied optics. 59(24)
- Publication Year :
- 2020
-
Abstract
- A light field microscope can realize three-dimensional measurement through only one exposure by the addition of a critical optical component called a microlens array (MLA). MLA errors will introduce aberrations in the captured image and then affect measurement results. This paper proposes a light field measuring system with aberration correction based on imaging analysis. The effect of MLA errors is investigated and quantitatively analyzed through a series of simulation studies. Aberration correction is realized based on computational imaging, in which an image segmentation and fusion distortion model is employed to correct the distortion, while a gradient-based linear recognition algorithm is used to address MLA rotation errors. Experimental results show that the developed light field measuring system can achieve improved measurement accuracy by correcting aberrations with the proposed algorithms.
- Subjects :
- Microlens
Microscope
Computer science
business.industry
Image quality
ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION
ComputerApplications_COMPUTERSINOTHERSYSTEMS
Image processing
Image segmentation
01 natural sciences
Atomic and Molecular Physics, and Optics
law.invention
010309 optics
Computational photography
Optics
law
Distortion
0103 physical sciences
Electrical and Electronic Engineering
business
Engineering (miscellaneous)
Rotation (mathematics)
Light field
Subjects
Details
- ISSN :
- 15394522
- Volume :
- 59
- Issue :
- 24
- Database :
- OpenAIRE
- Journal :
- Applied optics
- Accession number :
- edsair.doi.dedup.....e87e6dc880bd724baee7063179750b12