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Electron correlation, metallization, and Fermi-level pinning at ultrathin K/Si(111) interfaces

Authors :
Jing-Huei Chen
N. J. DiNardo
E. W. Plummer
Hanno H. Weitering
Source :
Physical Review B. 48:8119-8135
Publication Year :
1993
Publisher :
American Physical Society (APS), 1993.

Abstract

In this paper we present a detailed photoemission study of the K/Si(111)7[times]7 and K/Si(111)([radical]3 [times] [radical]3 )[ital R]30[degree]-B interfaces. Angle-resolved valence-band spectroscopy reveals the presence of an almost dispersionless interface state [ital below] [ital E][sub [ital F]]. Both interfaces are clearly nonmetallic at room-temperature saturation coverage. We critically address the issues of charge transfer and Fermi-level pinning by a detailed analysis of the K 3[ital p] and Si 2[ital p] core-level spectra. We conclude that, up to saturation coverage, correlation effects determine the electronic properties of these interfaces. Metallization occurs during the development of the second layer at cryogenic temperatures.

Details

ISSN :
10953795 and 01631829
Volume :
48
Database :
OpenAIRE
Journal :
Physical Review B
Accession number :
edsair.doi.dedup.....e6f124879e14a2f97199e05d296d285e
Full Text :
https://doi.org/10.1103/physrevb.48.8119