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Silicon laterally resonant microcantilevers for absolute pressure measurement with integrated actuation and readout

Authors :
Luciano Scaltrito
D. Bich
R. Correale
E. Giuri
P. Schina
Matteo Cocuzza
Alessandro Ricci
A. Merialdo
Ivan Ferrante
Source :
Journal of vacuum science & technology. B, Microelectronics and nanometer structures 26 (2008): 541–550. doi:10.1116/1.2870221, info:cnr-pdr/source/autori:Cocuzza M. a; Ferrante I. a; Ricci A. a; Giuri E. a; Scaltrito L. a; Bich D. b; Merialdo A. b; Schina P. b; Correale R. c/titolo:Silicon laterally resonant microcantilevers for absolute pressure measurement with integrated actuation and readout/doi:10.1116%2F1.2870221/rivista:Journal of vacuum science & technology. B, Microelectronics and nanometer structures/anno:2008/pagina_da:541/pagina_a:550/intervallo_pagine:541–550/volume:26
Publication Year :
2008
Publisher :
Published for the Society by the American Institute of Physics, New York , Stati Uniti d'America, 2008.

Abstract

This work is focused on the design, fabrication, and characterization of silicon laterally resonant microcantilevers for measuring absolute pressure. The authors have demonstrated the integration of resonance electrostatic actuation and capacitive readout with a microstructure based on a couple of electrodes and an external amplifier. The microcantilevers have been fabricated with a standard silicon on insulator micromachining process. The characterization method is based on measuring the current at the third harmonic of the excitation frequency flowing through the time-varying cantilever-based capacitor. The variation in resonance response of microcantilevers has been investigated as a function of pressure (10−2−105 Pa), both in terms of resonance frequency and quality factor. Theoretical models and experimental data show very good agreement. The microstructure behavior demonstrates the feasibility of an absolute pressure sensor working over a six-decade range with integrated electrical actuation and rea...

Details

Language :
English
Database :
OpenAIRE
Journal :
Journal of vacuum science & technology. B, Microelectronics and nanometer structures 26 (2008): 541–550. doi:10.1116/1.2870221, info:cnr-pdr/source/autori:Cocuzza M. a; Ferrante I. a; Ricci A. a; Giuri E. a; Scaltrito L. a; Bich D. b; Merialdo A. b; Schina P. b; Correale R. c/titolo:Silicon laterally resonant microcantilevers for absolute pressure measurement with integrated actuation and readout/doi:10.1116%2F1.2870221/rivista:Journal of vacuum science & technology. B, Microelectronics and nanometer structures/anno:2008/pagina_da:541/pagina_a:550/intervallo_pagine:541–550/volume:26
Accession number :
edsair.doi.dedup.....e4e923b8f0ccd6649cf593b44bbe503c
Full Text :
https://doi.org/10.1116/1.2870221