Cite
TEM and XRD characterizations of epitaxial silicon layer fabricated on double layer porous silicon
MLA
Isabelle Berbezier, et al. TEM and XRD Characterizations of Epitaxial Silicon Layer Fabricated on Double Layer Porous Silicon. Jan. 2016. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi.dedup.....e035ea6afe40f7072e88c6f3a3072fca&authtype=sso&custid=ns315887.
APA
Isabelle Berbezier, Luc Favre, R. Mahamdi, Antoine Ronda, S. Escoubas, Mansour Aouassa, L. Tebessi, & S. Gouder. (2016). TEM and XRD characterizations of epitaxial silicon layer fabricated on double layer porous silicon.
Chicago
Isabelle Berbezier, Luc Favre, R. Mahamdi, Antoine Ronda, S. Escoubas, Mansour Aouassa, L. Tebessi, and S. Gouder. 2016. “TEM and XRD Characterizations of Epitaxial Silicon Layer Fabricated on Double Layer Porous Silicon,” January. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi.dedup.....e035ea6afe40f7072e88c6f3a3072fca&authtype=sso&custid=ns315887.