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Thermal probe nanolithography: in-situ inspection, high-speed, high-resolution, 3D
- Source :
- SPIE Proceedings.
- Publication Year :
- 2013
- Publisher :
- SPIE, 2013.
-
Abstract
- Heated tips offer the possibility to create arbitrary high-resolution nanostructures by local decomposition and evaporation of resist materials. Turnaround times of minutes are achieved with this patterning method due to the high-speed direct-write process and an in-situ imaging capability. Dense features with 10 nm half-pitch can be written into thin films of organic resists such as self-amplified depolymerization (SAD) polymers or molecular glasses. The patterning speed of tSPL has been increased far beyond usual scanning probe lithography (SPL) technologies and approaches the speed of Gaussian shaped electron beam lithography (EBL) for
- Subjects :
- 010302 applied physics
Materials science
business.industry
02 engineering and technology
021001 nanoscience & nanotechnology
01 natural sciences
Image stitching
Optics
Nanolithography
Resist
0103 physical sciences
Multiple patterning
Thin film
0210 nano-technology
business
Scanning probe lithography
Electron-beam lithography
Thermal scanning probe lithography
Subjects
Details
- ISSN :
- 0277786X
- Database :
- OpenAIRE
- Journal :
- SPIE Proceedings
- Accession number :
- edsair.doi.dedup.....dedca6a6bf6dd2f078f16355bbbb380e
- Full Text :
- https://doi.org/10.1117/12.2032318