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A hybrid prognostics approach for MEMS: From real measurements to remaining useful life estimation
- Source :
- Microelectronics Reliability, Microelectronics Reliability, Elsevier, 2016, 65, pp.79-88. ⟨10.1016/j.microrel.2016.07.142⟩, Microelectronics Reliability, Elsevier, 2016, 65, pp.79-88
- Publication Year :
- 2016
- Publisher :
- Elsevier, 2016.
-
Abstract
- International audience; This paper presents a hybrid prognostics approach for Micro Electro Mechanical Systems (MEMS). This approach relies on two phases: an offline phase for the MEMS and its degradation modeling, and an online phase where the obtained degradation model is used with the available data for prognostics. In the online phase, the particle filter algorithm is used to perform online parameters estimation of the degradation model and predict the Remaining Useful Life (RUL) of MEMS. The effectiveness of the proposed approach is validated on experimental data related to an electro-thermally actuated MEMS valve.
- Subjects :
- [SPI.OTHER]Engineering Sciences [physics]/Other
0209 industrial biotechnology
Engineering
Remaining useful life
[INFO.INFO-DS]Computer Science [cs]/Data Structures and Algorithms [cs.DS]
02 engineering and technology
[INFO.INFO-SE]Computer Science [cs]/Software Engineering [cs.SE]
[SPI.AUTO]Engineering Sciences [physics]/Automatic
[INFO.INFO-IU]Computer Science [cs]/Ubiquitous Computing
Prognostics and health management
[INFO.INFO-CR]Computer Science [cs]/Cryptography and Security [cs.CR]
020901 industrial engineering & automation
Autre
Hardware_GENERAL
Degradation modeling
0202 electrical engineering, electronic engineering, information engineering
Health assessment
Electrical and Electronic Engineering
Safety, Risk, Reliability and Quality
Microelectromechanical systems
business.industry
020208 electrical & electronic engineering
Experimental data
Control engineering
Fault prognostics
Condensed Matter Physics
Modélisation et simulation
[INFO.INFO-MO]Computer Science [cs]/Modeling and Simulation
Atomic and Molecular Physics, and Optics
Manufacturing engineering
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
MEMS
[INFO.INFO-MA]Computer Science [cs]/Multiagent Systems [cs.MA]
Prognostics
[INFO.INFO-ET]Computer Science [cs]/Emerging Technologies [cs.ET]
[INFO.INFO-DC]Computer Science [cs]/Distributed, Parallel, and Cluster Computing [cs.DC]
business
Particle filtering algorithm
Subjects
Details
- Language :
- English
- ISSN :
- 00262714
- Database :
- OpenAIRE
- Journal :
- Microelectronics Reliability
- Accession number :
- edsair.doi.dedup.....dcd9d9280baf492ccbc4bcbb50d5ec9e
- Full Text :
- https://doi.org/10.1016/j.microrel.2016.07.142⟩