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Modeling and Characterization of Grain Boundaries and Slip Transmission in Dislocation Density-Based Crystal Plasticity
- Source :
- Crystals; Volume 7; Issue 6; Pages: 152
- Publication Year :
- 2017
- Publisher :
- Multidisciplinary Digital Publishing Institute, 2017.
-
Abstract
- In this study, a dislocation density-based model is introduced to analyze slip transmission across grain boundaries in polycrystalline materials. The method applies a combination of the misorientation of neighboring grains and resolved shear stress on relative slip planes. This model is implemented into a continuum dislocation dynamics framework and extended to consider the physical interaction between mobile dislocations and grain boundaries. The model takes full account of the geometry of the grain boundary, the normal and direction of incoming and outgoing slip systems, and the extended stress field of the boundary and dislocation pileups at the boundary. The model predicts that slip transmission is easier across grain boundaries when the misorientation angle between the grains is small. The modeling results are verified with experimental nanoindentation results for polycrystalline copper samples.
- Subjects :
- 010302 applied physics
Dislocation creep
Materials science
Misorientation
General Chemical Engineering
Geometry
02 engineering and technology
Slip (materials science)
021001 nanoscience & nanotechnology
Condensed Matter Physics
grain boundary dislocation interaction
visco plastic self-consistent method
continuum dislocation dynamics
Hall-Petch model
Nye’s tensor
nanoindentation
01 natural sciences
Inorganic Chemistry
Crystallography
Condensed Matter::Materials Science
Critical resolved shear stress
Peierls stress
0103 physical sciences
General Materials Science
Grain boundary
Dislocation
0210 nano-technology
Grain boundary strengthening
Subjects
Details
- Language :
- English
- ISSN :
- 20734352
- Database :
- OpenAIRE
- Journal :
- Crystals; Volume 7; Issue 6; Pages: 152
- Accession number :
- edsair.doi.dedup.....dc701d3e55210f877ddbaba073bcef93
- Full Text :
- https://doi.org/10.3390/cryst7060152