Cluster secondary ion emission of silicon: An influence of the samples' dimensional features

Authors :: Dejun Fu
A. E. Ieshkin
Vasiliy O. Pelenovich
M. N. Drozdov
Gennady P. Gololobov
S. F. Belykh
Paul Mazarov
Wenbin Zuo
Xiaomei Zeng
Dmitriy V. Suvorov
Alexander Tolstogouzov
Source :: Rapid communications in mass spectrometry : RCM. 33(3)
Publication Year :: 2018

Subjects :: Silicon
chemistry
Organic Chemistry
Cluster (physics)
chemistry.chemical_element
Ion emission
Molecular physics
Spectroscopy
Analytical Chemistry

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