Back to Search
Start Over
Development of a Cryogenic Test Bench for Spectral MTF Measurement on Midwave Infrared Focal Plane Arrays
- Source :
- Journal of Electronic Materials, Journal of Electronic Materials, Institute of Electrical and Electronics Engineers, 2020, 49 (11), pp.6957-6962. ⟨10.1007/s11664-020-08388-0⟩, Journal of Electronic Materials, 2020, 49 (11), pp.6957-6962. ⟨10.1007/s11664-020-08388-0⟩
- Publication Year :
- 2020
- Publisher :
- HAL CCSD, 2020.
-
Abstract
- International audience; The modulation transfer function (MTF) is one of the key figures of merit for the characterization of infrared focal plane arrays (FPA). Moreover, with both the trend of reduced pixel pitch and the variety of pixel structures observed in the industry, the study of the impact of wavelength on the MTF is also of great interest, and thus needs a spectro-spatial measurement. In this paper, we demonstrate such spectral MTF measurements in the mid-wavelength infrared (MWIR) band by the use of several spectral bandpass filters. We realize those measurements at 80 K on a specific n/p 320 × 256 HgCdTe MWIR FPA, divided into different areas. The pixel pitch is the same for all areas (30 μm), the only difference being the fill factor, which differs from one zone to another. The MTF measurement bench is based on a continuously self-imaging grating interferometer integrated in a specific cryogenic set-up.
- Subjects :
- Test bench
Cryogenic bench
Infrared
02 engineering and technology
Spectral measurement
Pixel confinement
01 natural sciences
Dot pitch
[SPI]Engineering Sciences [physics]
Optics
Band-pass filter
Optical transfer function
0103 physical sciences
Materials Chemistry
Figure of merit
Electrical and Electronic Engineering
010302 applied physics
Physics
[PHYS]Physics [physics]
Pixel
business.industry
021001 nanoscience & nanotechnology
Condensed Matter Physics
Modulation transfer function
Electronic, Optical and Magnetic Materials
Wavelength
0210 nano-technology
business
Subjects
Details
- Language :
- English
- ISSN :
- 03615235 and 1543186X
- Database :
- OpenAIRE
- Journal :
- Journal of Electronic Materials, Journal of Electronic Materials, Institute of Electrical and Electronics Engineers, 2020, 49 (11), pp.6957-6962. ⟨10.1007/s11664-020-08388-0⟩, Journal of Electronic Materials, 2020, 49 (11), pp.6957-6962. ⟨10.1007/s11664-020-08388-0⟩
- Accession number :
- edsair.doi.dedup.....db59dad153819ca84a8c37e40819d878
- Full Text :
- https://doi.org/10.1007/s11664-020-08388-0⟩