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Computing reliability: On the differences between software testing and software fault injection techniques

Authors :
Alberto Bosio
Firas Kaddachi
Lionel Torres
Pascal Benoit
Giorgio Di Natale
Maha Kooli
Laboratoire d'Electronique et des Technologies de l'Information ( CEA-LETI )
Commissariat à l'énergie atomique et aux énergies alternatives ( CEA ) -Université Grenoble Alpes [Saint Martin d'Hères]
TEST
Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier ( LIRMM )
Université de Montpellier ( UM ) -Centre National de la Recherche Scientifique ( CNRS ) -Université de Montpellier ( UM ) -Centre National de la Recherche Scientifique ( CNRS )
ADAptive Computing ( ADAC )
Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI)
Direction de Recherche Technologique (CEA) (DRT (CEA))
Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)
TEST (TEST)
Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM)
Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)
Interactive Digital Humans (IDH)
ADAptive Computing (ADAC)
Test and dEpendability of microelectronic integrated SysTems (TEST)
Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)
Source :
Microprocessors and Microsystems: Embedded Hardware Design (MICPRO), Microprocessors and Microsystems: Embedded Hardware Design (MICPRO), Elsevier, 2017, 50, pp.102-112. 〈10.1016/j.micpro.2017.02.007〉, Microprocessors and Microsystems: Embedded Hardware Design (MICPRO), Elsevier, 2017, 50, pp.102-112. ⟨10.1016/j.micpro.2017.02.007⟩, Microprocessors and Microsystems: Embedded Hardware Design, Microprocessors and Microsystems: Embedded Hardware Design, 2017, 50, pp.102-112. ⟨10.1016/j.micpro.2017.02.007⟩
Publication Year :
2017
Publisher :
HAL CCSD, 2017.

Abstract

International audience; System reliability has become a main concern during the computer-based system design process. It is one of the most important characteristics of the system quality. The continuous increase of the system complexity makes the reliability evaluation extremely costly. Therefore, there is need to develop new methods with less cost and effort. Furthermore, the system is vulnerable to both software and hardware faults. While the software faults are usually introduced by the programmer either at the design or the implementation stage of the software, the hardware faults are caused by physical phenomena affecting the hardware components, such as environmental perturbations, manufacturing defects, and aging-related phenomena. The software faults can only impact the software components. However, the hardware faults can propagate through the different system layers, and affect both the hardware and the software. This paper discusses the differences between the software testing and the software fault injections techniques used for reliability evaluation. We describe the mutation analysis as a method mainly used in software testing. Then, we detail the fault injection as a technique to evaluate the system reliability. Finally, we discuss how to use software mutation analysis in order to evaluate, at software level, the system reliability against hardware faults. The main advantage of this technique is its usability at early design stage of the system, when the instruction set architecture is not available. Experimental results run to evaluate faults occurring the memory show that the proposed approach significantly reduces the complexity of the system reliability evaluation in terms of time and cost.

Details

Language :
English
ISSN :
01419331 and 18729436
Database :
OpenAIRE
Journal :
Microprocessors and Microsystems: Embedded Hardware Design (MICPRO), Microprocessors and Microsystems: Embedded Hardware Design (MICPRO), Elsevier, 2017, 50, pp.102-112. 〈10.1016/j.micpro.2017.02.007〉, Microprocessors and Microsystems: Embedded Hardware Design (MICPRO), Elsevier, 2017, 50, pp.102-112. ⟨10.1016/j.micpro.2017.02.007⟩, Microprocessors and Microsystems: Embedded Hardware Design, Microprocessors and Microsystems: Embedded Hardware Design, 2017, 50, pp.102-112. ⟨10.1016/j.micpro.2017.02.007⟩
Accession number :
edsair.doi.dedup.....d8fa01107128942a71b35397b61f438b
Full Text :
https://doi.org/10.1016/j.micpro.2017.02.007〉