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BUILT-IN STRAIN MEASUREMENTS IN POROUS SILICON BY RAMAN SCATTERING
- Source :
- AISEM 2007, iTALY, 2007, info:cnr-pdr/source/autori:M.A. Ferrara, M.G. Donato, G. Messina, S. Santangelo, L. Sirleto, I. Rendina/congresso_nome:AISEM 2007/congresso_luogo:iTALY/congresso_data:2007/anno:2007/pagina_da:/pagina_a:/intervallo_pagine
- Publication Year :
- 2008
- Publisher :
- WORLD SCIENTIFIC, 2008.
Details
- Database :
- OpenAIRE
- Journal :
- Sensors and Microsystems
- Accession number :
- edsair.doi.dedup.....d83735ba455557693d3a49f53fc6abc6