Process Variation Aware Analysis of SRAM SEU Cross Sections Using Data Retention Voltage

MLA

Hayashi, Naoki, et al. “Process Variation Aware Analysis of SRAM SEU Cross Sections Using Data Retention Voltage.” IEEE Transactions on Nuclear Science, vol. 66, no. 1, Jan. 2019, pp. 155–62. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi.dedup.....d6e248baebf388390742ed805f650764&authtype=sso&custid=ns315887.

APA

Hayashi, N., Mori, Y., Kusano, M., Kobayashi, D., Hirose, K., Kakehashi, Y., Kawasaki, O., Makino, T., Ohshima, T., Matsuura, D., Narita, T., Ishii, S., & Masukawa, K. (2019). Process Variation Aware Analysis of SRAM SEU Cross Sections Using Data Retention Voltage. IEEE Transactions on Nuclear Science, 66(1), 155–162.

Chicago

Hayashi, Naoki, Yoshiharu Mori, Masaki Kusano, Daisuke Kobayashi, Kazuyuki Hirose, Yuya Kakehashi, Osamu Kawasaki, et al. 2019. “Process Variation Aware Analysis of SRAM SEU Cross Sections Using Data Retention Voltage.” IEEE Transactions on Nuclear Science 66 (1): 155–62. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi.dedup.....d6e248baebf388390742ed805f650764&authtype=sso&custid=ns315887.