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Residual layer-free reverse nanoimprint lithography on silicon and metal-coated substrates

Authors :
Theodor Nielsen
Clivia M. Sotomayor Torres
Ariadna Fernández
Nikolaos Kehagias
Markus Guttmann
Juan Medina
Lasse Højlund Thamdrup
Brian Bilenberg
Christian Benkel
European Commission
Ministerio de Economía y Competitividad (España)
Source :
Digital.CSIC. Repositorio Institucional del CSIC, instname
Publication Year :
2015
Publisher :
Elsevier, 2015.

Abstract

In this work we demonstrate that Reverse Nanoimprint Lithography is a feasible and flexible lithography technique applicable to the transfer of micro and nano polymer structures with no residual layer over areas of cm2 areas on silicon, metal and non-planar substrates. We used a flexible polydimethylsiloxane stamp with hydrophobic features. We present residual layer-free patterns imprinted using a commercial poly(methylmethacrylate) thermoplastic polymer over silicon, nickel and pre-patterned substrates. Our versatile patterning technology is adaptable to free form nano structuring and has coupling to adhesion technologies.<br />The support of the project PLAST-4-FUTURE funded by the European Commission (FP7-2012-NMP-ICT-FoF) under Grant Agreement number 314345 (www.plast4future.eu) and of the national project MAT-2012-31392 TAPHOR are gratefully acknowledged.

Details

ISSN :
18735568 and 01679317
Database :
OpenAIRE
Journal :
Microelectronic Engineering 141: 56-61 (2015)
Accession number :
edsair.doi.dedup.....d595758e4f97c98536f441ddad3ef0b1