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Highly automated electron energy-loss spectroscopy elemental quantification

Authors :
Raman D. Narayan
J. K. Weiss
Peter Rez
Source :
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 20(3)
Publication Year :
2014

Abstract

A model-based fitting algorithm for electron energy-loss spectroscopy spectra is introduced, along with an intuitive user-interface. As with Verbeeck & Van Aert, the measured spectrum, rather than the single scattering distribution, is fit over a wide range. An approximation is developed that allows for accurate modeling while maintaining linearity in the parameters that represent elemental composition. Also, a method is given for generating a model for the low-loss background that incorporates plural scattering. Operation of the user-interface is described to demonstrate the ease of use that allows even nonexpert users to quickly obtain elemental analysis results.

Details

ISSN :
14358115
Volume :
20
Issue :
3
Database :
OpenAIRE
Journal :
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
Accession number :
edsair.doi.dedup.....d1060b8c98910444b3b12a82f6b4e15f